Improvement in Device Performance and Reliability of Organic Light-Emitting Diodes through Deposition Rate Control
We demonstrated a fabrication technique to reduce the driving voltage, increase the current efficiency, and extend the operating lifetime of an organic light-emitting diode (OLED) by simply controlling the deposition rate of bis(10-hydroxybenzo[h]qinolinato) beryllium (Bebq2) used as the emitting la...
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Language: | English |
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Wiley
2014-01-01
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Series: | International Journal of Photoenergy |
Online Access: | http://dx.doi.org/10.1155/2014/412084 |
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author | Shun-Wei Liu Chih-Chien Lee Yu-Ting Chung Jiun-Haw Lee Chin-Ti Chen Juen-Kai Wang |
author_facet | Shun-Wei Liu Chih-Chien Lee Yu-Ting Chung Jiun-Haw Lee Chin-Ti Chen Juen-Kai Wang |
author_sort | Shun-Wei Liu |
collection | DOAJ |
description | We demonstrated a fabrication technique to reduce the driving voltage, increase the current efficiency, and extend the operating lifetime of an organic light-emitting diode (OLED) by simply controlling the deposition rate of bis(10-hydroxybenzo[h]qinolinato) beryllium (Bebq2) used as the emitting layer and the electron-transport layer. In our optimized device, 55 nm of Bebq2 was first deposited at a faster deposition rate of 1.3 nm/s, followed by the deposition of a thin Bebq2 (5 nm) layer at a slower rate of 0.03 nm/s. The Bebq2 layer with the faster deposition rate exhibited higher photoluminescence efficiency and was suitable for use in light emission. The thin Bebq2 layer with the slower deposition rate was used to modify the interface between the Bebq2 and cathode and hence improve the injection efficiency and lower the driving voltage. The operating lifetime of such a two-step deposition OLED was 1.92 and 4.6 times longer than that of devices with a single deposition rate, that is, 1.3 and 0.03 nm/s cases, respectively. |
format | Article |
id | doaj-art-5cd1658cd45d428597a607c9920bf0ba |
institution | Kabale University |
issn | 1110-662X 1687-529X |
language | English |
publishDate | 2014-01-01 |
publisher | Wiley |
record_format | Article |
series | International Journal of Photoenergy |
spelling | doaj-art-5cd1658cd45d428597a607c9920bf0ba2025-02-03T01:03:12ZengWileyInternational Journal of Photoenergy1110-662X1687-529X2014-01-01201410.1155/2014/412084412084Improvement in Device Performance and Reliability of Organic Light-Emitting Diodes through Deposition Rate ControlShun-Wei Liu0Chih-Chien Lee1Yu-Ting Chung2Jiun-Haw Lee3Chin-Ti Chen4Juen-Kai Wang5Department of Electronic Engineering, Ming Chi University of Technology, New Taipei City 24301, TaiwanDepartment of Electronic Engineering, National Taiwan University of Science and Technology, Taipei 106, TaiwanDepartment of Electronic Engineering, National Taiwan University of Science and Technology, Taipei 106, TaiwanGraduate Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei 106, TaiwanInstitute of Chemistry, Academia Sinica, Taipei 11529, TaiwanCenter for Condensed Matter Sciences, National Taiwan University, Taipei 106, TaiwanWe demonstrated a fabrication technique to reduce the driving voltage, increase the current efficiency, and extend the operating lifetime of an organic light-emitting diode (OLED) by simply controlling the deposition rate of bis(10-hydroxybenzo[h]qinolinato) beryllium (Bebq2) used as the emitting layer and the electron-transport layer. In our optimized device, 55 nm of Bebq2 was first deposited at a faster deposition rate of 1.3 nm/s, followed by the deposition of a thin Bebq2 (5 nm) layer at a slower rate of 0.03 nm/s. The Bebq2 layer with the faster deposition rate exhibited higher photoluminescence efficiency and was suitable for use in light emission. The thin Bebq2 layer with the slower deposition rate was used to modify the interface between the Bebq2 and cathode and hence improve the injection efficiency and lower the driving voltage. The operating lifetime of such a two-step deposition OLED was 1.92 and 4.6 times longer than that of devices with a single deposition rate, that is, 1.3 and 0.03 nm/s cases, respectively.http://dx.doi.org/10.1155/2014/412084 |
spellingShingle | Shun-Wei Liu Chih-Chien Lee Yu-Ting Chung Jiun-Haw Lee Chin-Ti Chen Juen-Kai Wang Improvement in Device Performance and Reliability of Organic Light-Emitting Diodes through Deposition Rate Control International Journal of Photoenergy |
title | Improvement in Device Performance and Reliability of Organic Light-Emitting Diodes through Deposition Rate Control |
title_full | Improvement in Device Performance and Reliability of Organic Light-Emitting Diodes through Deposition Rate Control |
title_fullStr | Improvement in Device Performance and Reliability of Organic Light-Emitting Diodes through Deposition Rate Control |
title_full_unstemmed | Improvement in Device Performance and Reliability of Organic Light-Emitting Diodes through Deposition Rate Control |
title_short | Improvement in Device Performance and Reliability of Organic Light-Emitting Diodes through Deposition Rate Control |
title_sort | improvement in device performance and reliability of organic light emitting diodes through deposition rate control |
url | http://dx.doi.org/10.1155/2014/412084 |
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