Shiba, S., & Sueoka, K. TEM Observation of the Dislocations Nucleated from Cracks inside Lightly or Heavily Doped Czochralski Silicon Wafers. Wiley.
Chicago Style (17th ed.) CitationShiba, Seiji, and Koji Sueoka. TEM Observation of the Dislocations Nucleated from Cracks Inside Lightly or Heavily Doped Czochralski Silicon Wafers. Wiley.
MLA (9th ed.) CitationShiba, Seiji, and Koji Sueoka. TEM Observation of the Dislocations Nucleated from Cracks Inside Lightly or Heavily Doped Czochralski Silicon Wafers. Wiley.
Warning: These citations may not always be 100% accurate.