Tomić, D., & Šipuš, Z. Symmetry Breaking as a Basis for Characterization of Dielectric Materials. MDPI AG.
Chicago Style (17th ed.) CitationTomić, Dubravko, and Zvonimir Šipuš. Symmetry Breaking as a Basis for Characterization of Dielectric Materials. MDPI AG.
MLA (9th ed.) CitationTomić, Dubravko, and Zvonimir Šipuš. Symmetry Breaking as a Basis for Characterization of Dielectric Materials. MDPI AG.
Warning: These citations may not always be 100% accurate.