Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements
Ferroelectric thin films integrated on passive photonic platforms offer ways to achieve functionalities that are otherwise impossible or inefficient, such as electro-optic (EO) modulation, acousto-optic modulation or optical nonlinear conversion. Characterization methods of the EO properties of thin...
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| Format: | Article |
| Language: | English |
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IOP Publishing
2025-01-01
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| Series: | JPhys Photonics |
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| Online Access: | https://doi.org/10.1088/2515-7647/ada902 |
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| author | Kobe De Geest Enes Lievens Ewout Picavet Klaartje De Buysser Dries Van Thourhout Jeroen Beeckman |
| author_facet | Kobe De Geest Enes Lievens Ewout Picavet Klaartje De Buysser Dries Van Thourhout Jeroen Beeckman |
| author_sort | Kobe De Geest |
| collection | DOAJ |
| description | Ferroelectric thin films integrated on passive photonic platforms offer ways to achieve functionalities that are otherwise impossible or inefficient, such as electro-optic (EO) modulation, acousto-optic modulation or optical nonlinear conversion. Characterization methods of the EO properties of thin films are often only able to extract an effective EO response, while in many integrated photonic circuits it is one of the Pockels coefficients that determines the strength of the modulation. In this work, we demonstrate a new method to extract the r _33 and the r _13 coefficient independently by measuring the change in polarization and amplitude of light reflected at the sample, taking into account multiple reflections and interference effects. This method is verified for highly textured Pb(Zr,Ti)O _3 and BaTiO _3 thin films. |
| format | Article |
| id | doaj-art-5b625f78937b4a7fa8694cb68882eeaf |
| institution | Kabale University |
| issn | 2515-7647 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | JPhys Photonics |
| spelling | doaj-art-5b625f78937b4a7fa8694cb68882eeaf2025-01-22T10:35:26ZengIOP PublishingJPhys Photonics2515-76472025-01-017101501210.1088/2515-7647/ada902Extraction of individual Pockels coefficients of thin films via interferometric reflection measurementsKobe De Geest0https://orcid.org/0000-0002-5669-975XEnes Lievens1https://orcid.org/0009-0001-9867-4665Ewout Picavet2https://orcid.org/0000-0001-8196-2807Klaartje De Buysser3https://orcid.org/0000-0001-7462-2484Dries Van Thourhout4https://orcid.org/0000-0003-0111-431XJeroen Beeckman5https://orcid.org/0000-0002-0711-2465Liquid Crystals & Photonics group, Department of Electronics and Information Systems, Ghent University , Technologiepark-Zwijnaarde 126, 9052 Ghent, Belgium; Photonics Research Group, Department of Information Technology, Ghent University , Technologiepark-Zwijnaarde 126, 9052 Ghent, BelgiumLiquid Crystals & Photonics group, Department of Electronics and Information Systems, Ghent University , Technologiepark-Zwijnaarde 126, 9052 Ghent, Belgium; Photonics Research Group, Department of Information Technology, Ghent University , Technologiepark-Zwijnaarde 126, 9052 Ghent, BelgiumLiquid Crystals & Photonics group, Department of Electronics and Information Systems, Ghent University , Technologiepark-Zwijnaarde 126, 9052 Ghent, Belgium; SCRiPTS group, Department of Chemistry ,Krijgslaan 281 - building S3, 9000 Gent, BelgiumSCRiPTS group, Department of Chemistry ,Krijgslaan 281 - building S3, 9000 Gent, BelgiumPhotonics Research Group, Department of Information Technology, Ghent University , Technologiepark-Zwijnaarde 126, 9052 Ghent, Belgium; IMEC , Technologiepark-Zwijnaarde 126, 9052 Ghent, BelgiumLiquid Crystals & Photonics group, Department of Electronics and Information Systems, Ghent University , Technologiepark-Zwijnaarde 126, 9052 Ghent, BelgiumFerroelectric thin films integrated on passive photonic platforms offer ways to achieve functionalities that are otherwise impossible or inefficient, such as electro-optic (EO) modulation, acousto-optic modulation or optical nonlinear conversion. Characterization methods of the EO properties of thin films are often only able to extract an effective EO response, while in many integrated photonic circuits it is one of the Pockels coefficients that determines the strength of the modulation. In this work, we demonstrate a new method to extract the r _33 and the r _13 coefficient independently by measuring the change in polarization and amplitude of light reflected at the sample, taking into account multiple reflections and interference effects. This method is verified for highly textured Pb(Zr,Ti)O _3 and BaTiO _3 thin films.https://doi.org/10.1088/2515-7647/ada902Pockels effectferroelectric thin filmsPb(Zr,Ti)O3BaTiO3electro-optic modulation |
| spellingShingle | Kobe De Geest Enes Lievens Ewout Picavet Klaartje De Buysser Dries Van Thourhout Jeroen Beeckman Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements JPhys Photonics Pockels effect ferroelectric thin films Pb(Zr,Ti)O3 BaTiO3 electro-optic modulation |
| title | Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements |
| title_full | Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements |
| title_fullStr | Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements |
| title_full_unstemmed | Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements |
| title_short | Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements |
| title_sort | extraction of individual pockels coefficients of thin films via interferometric reflection measurements |
| topic | Pockels effect ferroelectric thin films Pb(Zr,Ti)O3 BaTiO3 electro-optic modulation |
| url | https://doi.org/10.1088/2515-7647/ada902 |
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