Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements
Ferroelectric thin films integrated on passive photonic platforms offer ways to achieve functionalities that are otherwise impossible or inefficient, such as electro-optic (EO) modulation, acousto-optic modulation or optical nonlinear conversion. Characterization methods of the EO properties of thin...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2025-01-01
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| Series: | JPhys Photonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/2515-7647/ada902 |
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| Summary: | Ferroelectric thin films integrated on passive photonic platforms offer ways to achieve functionalities that are otherwise impossible or inefficient, such as electro-optic (EO) modulation, acousto-optic modulation or optical nonlinear conversion. Characterization methods of the EO properties of thin films are often only able to extract an effective EO response, while in many integrated photonic circuits it is one of the Pockels coefficients that determines the strength of the modulation. In this work, we demonstrate a new method to extract the r _33 and the r _13 coefficient independently by measuring the change in polarization and amplitude of light reflected at the sample, taking into account multiple reflections and interference effects. This method is verified for highly textured Pb(Zr,Ti)O _3 and BaTiO _3 thin films. |
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| ISSN: | 2515-7647 |