APA (7th ed.) Citation

Murakami, R., Sasaki, T. T., Yoshikawa, H., Matsushita, Y., Sodeyama, K., Ohkubo, T., . . . Nagata, K. Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data. Taylor & Francis Group.

Chicago Style (17th ed.) Citation

Murakami, Ryo, Taisuke T. Sasaki, Hideki Yoshikawa, Yoshitaka Matsushita, Keitaro Sodeyama, Tadakatsu Ohkubo, Hiroshi Shinotsuka, and Kenji Nagata. Bayesian Inference for Peak Feature Extraction and Prediction of Material Property in X-ray Diffraction Data. Taylor & Francis Group.

MLA (9th ed.) Citation

Murakami, Ryo, et al. Bayesian Inference for Peak Feature Extraction and Prediction of Material Property in X-ray Diffraction Data. Taylor & Francis Group.