Essig, R., Li, P., Liu, Z., McDuffie, M., Plestid, R., & Xu, H. Probing millicharged particles at an electron beam dump with ultralow-threshold sensors. SpringerOpen.
Chicago Style (17th ed.) CitationEssig, Rouven, Peiran Li, Zhen Liu, Megan McDuffie, Ryan Plestid, and Hailin Xu. Probing Millicharged Particles at an Electron Beam Dump with Ultralow-threshold Sensors. SpringerOpen.
MLA (9th ed.) CitationEssig, Rouven, et al. Probing Millicharged Particles at an Electron Beam Dump with Ultralow-threshold Sensors. SpringerOpen.
Warning: These citations may not always be 100% accurate.