Fan, C., Chen, L., Cheng, J., Wang, Y., Xu, L., & Li, J. Predicting plaque regression based on plaque characteristics identified by optical coherence tomography: A retrospective study. Elsevier.
Chicago Style (17th ed.) CitationFan, Cheng-Hui, Lyu-fan Chen, Jing Cheng, Yi-Qiong Wang, Ling-Hao Xu, and Ji-Ming Li. Predicting Plaque Regression Based on Plaque Characteristics Identified by Optical Coherence Tomography: A Retrospective Study. Elsevier.
MLA (9th ed.) CitationFan, Cheng-Hui, et al. Predicting Plaque Regression Based on Plaque Characteristics Identified by Optical Coherence Tomography: A Retrospective Study. Elsevier.
Warning: These citations may not always be 100% accurate.