Oxygen effect on the performance of β-Ga2O3 enhancement mode MOSFETs heteroepitaxially grown on a sapphire

β-Ga2O3 is regarded as a promising candidate for next-generation high-power devices; however, the impact of material quality on device performance is significant and not yet well understood. In this study, β-Ga2O3 heteroepilayers were grown on c-plane sapphire using metalorganic chemical vapor depos...

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Main Authors: Yueh-Han Chuang, Fu-Gow Tarntair, Tzu-Wei Wang, Anoop Kumar Singh, Po-Liang Liu, Dong-Sing Wuu, Hao-Chung Kuo, Xiuling Li, Ray-Hua Horng
Format: Article
Language:English
Published: Elsevier 2025-03-01
Series:Applied Surface Science Advances
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Online Access:http://www.sciencedirect.com/science/article/pii/S2666523925000200
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author Yueh-Han Chuang
Fu-Gow Tarntair
Tzu-Wei Wang
Anoop Kumar Singh
Po-Liang Liu
Dong-Sing Wuu
Hao-Chung Kuo
Xiuling Li
Ray-Hua Horng
author_facet Yueh-Han Chuang
Fu-Gow Tarntair
Tzu-Wei Wang
Anoop Kumar Singh
Po-Liang Liu
Dong-Sing Wuu
Hao-Chung Kuo
Xiuling Li
Ray-Hua Horng
author_sort Yueh-Han Chuang
collection DOAJ
description β-Ga2O3 is regarded as a promising candidate for next-generation high-power devices; however, the impact of material quality on device performance is significant and not yet well understood. In this study, β-Ga2O3 heteroepilayers were grown on c-plane sapphire using metalorganic chemical vapor deposition (MOCVD) at three different O2 flow rates. Enhancement-mode β-Ga2O3 metal-oxide-semiconductor field-effect transistors (MOSFETs) were then fabricated with a gate-recessed process, incorporating a 5 µm gate field plate structure. Higher O2 flow rates resulted in increased breakdown voltage. X-ray photoelectron spectroscopy analysis suggests that this improvement is due to reduced oxygen vacancies and minimized Al diffusion from the substrate. First-principle simulations further confirmed this phenomenon.
format Article
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institution Kabale University
issn 2666-5239
language English
publishDate 2025-03-01
publisher Elsevier
record_format Article
series Applied Surface Science Advances
spelling doaj-art-53f5fd5d32da4700a7048af9330367ab2025-02-05T04:32:41ZengElsevierApplied Surface Science Advances2666-52392025-03-0126100711Oxygen effect on the performance of β-Ga2O3 enhancement mode MOSFETs heteroepitaxially grown on a sapphireYueh-Han Chuang0Fu-Gow Tarntair1Tzu-Wei Wang2Anoop Kumar Singh3Po-Liang Liu4Dong-Sing Wuu5Hao-Chung Kuo6Xiuling Li7Ray-Hua Horng8Institute of Electronics Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROC; Institute of Pioneer Semiconductor Innovation, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROCInstitute of Electronics Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROCGraduate Institute of Precision Engineering, National Chung Hsing University, Taichung 40227, Taiwan, ROCDepartment of Applied Materials and Optoelectronic Engineering, National Chi Nan University, Taiwan, ROCGraduate Institute of Precision Engineering, National Chung Hsing University, Taichung 40227, Taiwan, ROC; Department of Applied Materials and Optoelectronic Engineering, National Chi Nan University, Taiwan, ROCDepartment of Applied Materials and Optoelectronic Engineering, National Chi Nan University, Taiwan, ROCDepartment of Photonics and Institute of Electro-Optical Engineering, College of Electrical and Computer Engineering, National Yang-Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROCDepartment of Electrical and Computer Engineering, Microelectronics Research Center, The University of Texas at Austin, TX 78758, USAInstitute of Electronics Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROC; Corresponding author.β-Ga2O3 is regarded as a promising candidate for next-generation high-power devices; however, the impact of material quality on device performance is significant and not yet well understood. In this study, β-Ga2O3 heteroepilayers were grown on c-plane sapphire using metalorganic chemical vapor deposition (MOCVD) at three different O2 flow rates. Enhancement-mode β-Ga2O3 metal-oxide-semiconductor field-effect transistors (MOSFETs) were then fabricated with a gate-recessed process, incorporating a 5 µm gate field plate structure. Higher O2 flow rates resulted in increased breakdown voltage. X-ray photoelectron spectroscopy analysis suggests that this improvement is due to reduced oxygen vacancies and minimized Al diffusion from the substrate. First-principle simulations further confirmed this phenomenon.http://www.sciencedirect.com/science/article/pii/S2666523925000200Al diffusionꞵ-Ga2O3Enhancement-mode MOSFETsGate field plateMOCVDOxygen vacancies
spellingShingle Yueh-Han Chuang
Fu-Gow Tarntair
Tzu-Wei Wang
Anoop Kumar Singh
Po-Liang Liu
Dong-Sing Wuu
Hao-Chung Kuo
Xiuling Li
Ray-Hua Horng
Oxygen effect on the performance of β-Ga2O3 enhancement mode MOSFETs heteroepitaxially grown on a sapphire
Applied Surface Science Advances
Al diffusion
ꞵ-Ga2O3
Enhancement-mode MOSFETs
Gate field plate
MOCVD
Oxygen vacancies
title Oxygen effect on the performance of β-Ga2O3 enhancement mode MOSFETs heteroepitaxially grown on a sapphire
title_full Oxygen effect on the performance of β-Ga2O3 enhancement mode MOSFETs heteroepitaxially grown on a sapphire
title_fullStr Oxygen effect on the performance of β-Ga2O3 enhancement mode MOSFETs heteroepitaxially grown on a sapphire
title_full_unstemmed Oxygen effect on the performance of β-Ga2O3 enhancement mode MOSFETs heteroepitaxially grown on a sapphire
title_short Oxygen effect on the performance of β-Ga2O3 enhancement mode MOSFETs heteroepitaxially grown on a sapphire
title_sort oxygen effect on the performance of β ga2o3 enhancement mode mosfets heteroepitaxially grown on a sapphire
topic Al diffusion
ꞵ-Ga2O3
Enhancement-mode MOSFETs
Gate field plate
MOCVD
Oxygen vacancies
url http://www.sciencedirect.com/science/article/pii/S2666523925000200
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