Microstructural and Dielectric Properties of Zr Doped Microwave Sintered CaCu3Ti4O12 Synthesized by Sol-Gel Route
Polycrystalline samples with the chemical formula CaCu3Ti4-xZrxO12 (x=0, 0.02, 0.1, 0.2, 0.5, and 0.1) CCTZO were synthesized from metal nitrate solutions by the sol-gel method, followed by conventional and microwave heat treatments. The X-ray diffraction pattern of powder calcined at 800°C in conve...
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Wiley
2014-01-01
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| Series: | Advances in Materials Science and Engineering |
| Online Access: | http://dx.doi.org/10.1155/2014/187420 |
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| author | S. Jesurani S. Kanagesan M. Hashim I. Ismail I. R. Ibrahim |
| author_facet | S. Jesurani S. Kanagesan M. Hashim I. Ismail I. R. Ibrahim |
| author_sort | S. Jesurani |
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| description | Polycrystalline samples with the chemical formula CaCu3Ti4-xZrxO12 (x=0, 0.02, 0.1, 0.2, 0.5, and 0.1) CCTZO were synthesized from metal nitrate solutions by the sol-gel method, followed by conventional and microwave heat treatments. The X-ray diffraction pattern of powder calcined at 800°C in conventional furnace for 3 h showed formation of a single phase. The crystal structure did not change on doping with zirconium and it remained cubic in the five studied compositions. The surface morphology of samples sintered at 1000°C in microwave furnace for 10 min was observed using a high resolution scanning electron microscope (HR-SEM). The grain sizes were in the range of 250 nm–5 μm for these samples. HRSEM results show that doping with Zr enhanced grain growth or densification. Energy dispersive X-ray spectroscopy (EDX) confirmed the presence of Zr. The dielectric characteristics of Zr doped CCTO were studied with an LCR meter in the frequency range of 50 Hz–1 MHz. A very high dielectric constant 21,500 was observed for the sample doped with Zr (0.02 mol%) at 50 Hz. |
| format | Article |
| id | doaj-art-514276c987cc4e80b611c6738eeec3ca |
| institution | Kabale University |
| issn | 1687-8434 1687-8442 |
| language | English |
| publishDate | 2014-01-01 |
| publisher | Wiley |
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| series | Advances in Materials Science and Engineering |
| spelling | doaj-art-514276c987cc4e80b611c6738eeec3ca2025-02-03T01:33:10ZengWileyAdvances in Materials Science and Engineering1687-84341687-84422014-01-01201410.1155/2014/187420187420Microstructural and Dielectric Properties of Zr Doped Microwave Sintered CaCu3Ti4O12 Synthesized by Sol-Gel RouteS. Jesurani0S. Kanagesan1M. Hashim2I. Ismail3I. R. Ibrahim4Department of Physics, Jayaraj Annapackiam College for Women, Periyakulam, Tamil Nadu 625601, IndiaMaterials Synthesis and Characterization Laboratory (MSCL), Institute of Advanced Technology (ITMA), Universiti Putra Malaysia, 43400 Serdang, Selangor, MalaysiaMaterials Synthesis and Characterization Laboratory (MSCL), Institute of Advanced Technology (ITMA), Universiti Putra Malaysia, 43400 Serdang, Selangor, MalaysiaMaterials Synthesis and Characterization Laboratory (MSCL), Institute of Advanced Technology (ITMA), Universiti Putra Malaysia, 43400 Serdang, Selangor, MalaysiaMaterials Synthesis and Characterization Laboratory (MSCL), Institute of Advanced Technology (ITMA), Universiti Putra Malaysia, 43400 Serdang, Selangor, MalaysiaPolycrystalline samples with the chemical formula CaCu3Ti4-xZrxO12 (x=0, 0.02, 0.1, 0.2, 0.5, and 0.1) CCTZO were synthesized from metal nitrate solutions by the sol-gel method, followed by conventional and microwave heat treatments. The X-ray diffraction pattern of powder calcined at 800°C in conventional furnace for 3 h showed formation of a single phase. The crystal structure did not change on doping with zirconium and it remained cubic in the five studied compositions. The surface morphology of samples sintered at 1000°C in microwave furnace for 10 min was observed using a high resolution scanning electron microscope (HR-SEM). The grain sizes were in the range of 250 nm–5 μm for these samples. HRSEM results show that doping with Zr enhanced grain growth or densification. Energy dispersive X-ray spectroscopy (EDX) confirmed the presence of Zr. The dielectric characteristics of Zr doped CCTO were studied with an LCR meter in the frequency range of 50 Hz–1 MHz. A very high dielectric constant 21,500 was observed for the sample doped with Zr (0.02 mol%) at 50 Hz.http://dx.doi.org/10.1155/2014/187420 |
| spellingShingle | S. Jesurani S. Kanagesan M. Hashim I. Ismail I. R. Ibrahim Microstructural and Dielectric Properties of Zr Doped Microwave Sintered CaCu3Ti4O12 Synthesized by Sol-Gel Route Advances in Materials Science and Engineering |
| title | Microstructural and Dielectric Properties of Zr Doped Microwave Sintered CaCu3Ti4O12 Synthesized by Sol-Gel Route |
| title_full | Microstructural and Dielectric Properties of Zr Doped Microwave Sintered CaCu3Ti4O12 Synthesized by Sol-Gel Route |
| title_fullStr | Microstructural and Dielectric Properties of Zr Doped Microwave Sintered CaCu3Ti4O12 Synthesized by Sol-Gel Route |
| title_full_unstemmed | Microstructural and Dielectric Properties of Zr Doped Microwave Sintered CaCu3Ti4O12 Synthesized by Sol-Gel Route |
| title_short | Microstructural and Dielectric Properties of Zr Doped Microwave Sintered CaCu3Ti4O12 Synthesized by Sol-Gel Route |
| title_sort | microstructural and dielectric properties of zr doped microwave sintered cacu3ti4o12 synthesized by sol gel route |
| url | http://dx.doi.org/10.1155/2014/187420 |
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