Noncontact Monitoring and Imaging of the Operation and Performance of Thin‐Film Field‐Effect Transistors
Abstract In this study, the first noncontact and non‐destructive methodology is developed for monitoring and imaging the operation and performance of thin‐film field‐effect transistors (TFTs) using second‐harmonic generation (SHG) imaging. By analyzing the SHG signal intensity, which is directly rel...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2025-02-01
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| Series: | Advanced Science |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/advs.202407923 |
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