Analysis of the failure mechanism of ZnO varistors influenced by high‐resistance media based on multi‐field coupling simulation

Abstract This study focuses on the distribution of high‐resistance media (pores and spinels) within ZnO varistors and explores the mechanical and electrical failure mechanisms of varistors under different pulse actions. Micro‐CT technology revealed that the proportion of high‐resistance media in the...

Full description

Saved in:
Bibliographic Details
Main Authors: Pengfei Meng, Yue Yin, Lei Wang, Jingke Guo, Zerui Li, Kai Zhou, Guangya Zhu, Yefei Xu
Format: Article
Language:English
Published: Wiley 2025-06-01
Series:High Voltage
Online Access:https://doi.org/10.1049/hve2.70034
Tags: Add Tag
No Tags, Be the first to tag this record!