APA (7th ed.) Citation

Khan, Z. N., Ahmed, S., & Ali, M. Electrical Characterization of Postmetal Annealed Ultrathin TiN Gate Electrodes in Si MOS Capacitors. Wiley.

Chicago Style (17th ed.) Citation

Khan, Z. N., S. Ahmed, and M. Ali. Electrical Characterization of Postmetal Annealed Ultrathin TiN Gate Electrodes in Si MOS Capacitors. Wiley.

MLA (9th ed.) Citation

Khan, Z. N., et al. Electrical Characterization of Postmetal Annealed Ultrathin TiN Gate Electrodes in Si MOS Capacitors. Wiley.

Warning: These citations may not always be 100% accurate.