A Novel Low-Rank Embedded Latent Multi-View Subspace Clustering Approach

Noises and outliers often degrade the final prediction performance in practical data processing. Multi-view learning by integrating complementary information across heterogeneous modalities has become one of the core techniques in the field of machine learning. However, existing methods rely on expl...

Full description

Saved in:
Bibliographic Details
Main Authors: Sen Wang, Lian Chen, Zhijian Liang, Qingyang Liu
Format: Article
Language:English
Published: MDPI AG 2025-04-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/25/9/2778
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Noises and outliers often degrade the final prediction performance in practical data processing. Multi-view learning by integrating complementary information across heterogeneous modalities has become one of the core techniques in the field of machine learning. However, existing methods rely on explicit-view clustering and stringent alignment assumptions, which affect the effectiveness in addressing the challenges such as inconsistencies between views, noise interference, and misalignment across different views. To alleviate these issues, we present a latent multi-view representation learning model based on low-rank embedding by implicitly uncovering the latent consistency structure of data, which allows us to achieve robust and efficient multi-view feature fusion. In particular, we utilize low-rank constraints to construct a unified latent subspace representation and introduce an adaptive noise suppression mechanism that significantly enhances robustness against outliers and noise interference. Moreover, the Augmented Lagrangian Multiplier Alternating Direction Minimization (ALM-ADM) framework enables efficient optimization of the proposed method. Experimental results on multiple benchmark datasets demonstrate that the proposed approach outperforms existing state-of-the-art methods in both clustering performance and robustness.
ISSN:1424-8220