Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates

Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates

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Bibliographic Details
Main Authors:	C. Thebault, R. Schnitzler, J. P. Ramy
Format:	Article
Language:	English
Published:	Wiley 1983-01-01
Series:	Active and Passive Electronic Components
Online Access:	http://dx.doi.org/10.1155/APEC.10.157
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