Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates

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Bibliographic Details
Main Authors: C. Thebault, R. Schnitzler, J. P. Ramy
Format: Article
Language:English
Published: Wiley 1983-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.10.157
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