Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates

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Bibliographic Details
Main Authors: C. Thebault, R. Schnitzler, J. P. Ramy
Format: Article
Language:English
Published: Wiley 1983-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.10.157
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author C. Thebault
R. Schnitzler
J. P. Ramy
author_facet C. Thebault
R. Schnitzler
J. P. Ramy
author_sort C. Thebault
collection DOAJ
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institution Kabale University
issn 0882-7516
1563-5031
language English
publishDate 1983-01-01
publisher Wiley
record_format Article
series Active and Passive Electronic Components
spelling doaj-art-44585c1629a4464783ecd3bc68c237d22025-02-03T01:02:04ZengWileyActive and Passive Electronic Components0882-75161563-50311983-01-01102-315716210.1155/APEC.10.157Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina SubstratesC. ThebaultR. SchnitzlerJ. P. Ramyhttp://dx.doi.org/10.1155/APEC.10.157
spellingShingle C. Thebault
R. Schnitzler
J. P. Ramy
Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates
Active and Passive Electronic Components
title Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates
title_full Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates
title_fullStr Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates
title_full_unstemmed Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates
title_short Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates
title_sort experimental and theoretical characterization of thick and thin films for microwave uses on 99 6 37 alumina substrates
url http://dx.doi.org/10.1155/APEC.10.157
work_keys_str_mv AT cthebault experimentalandtheoreticalcharacterizationofthickandthinfilmsformicrowaveuseson99637aluminasubstrates
AT rschnitzler experimentalandtheoreticalcharacterizationofthickandthinfilmsformicrowaveuseson99637aluminasubstrates
AT jpramy experimentalandtheoreticalcharacterizationofthickandthinfilmsformicrowaveuseson99637aluminasubstrates