Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates
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Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
Wiley
1983-01-01
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Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/APEC.10.157 |
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_version_ | 1832567227150237696 |
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author | C. Thebault R. Schnitzler J. P. Ramy |
author_facet | C. Thebault R. Schnitzler J. P. Ramy |
author_sort | C. Thebault |
collection | DOAJ |
format | Article |
id | doaj-art-44585c1629a4464783ecd3bc68c237d2 |
institution | Kabale University |
issn | 0882-7516 1563-5031 |
language | English |
publishDate | 1983-01-01 |
publisher | Wiley |
record_format | Article |
series | Active and Passive Electronic Components |
spelling | doaj-art-44585c1629a4464783ecd3bc68c237d22025-02-03T01:02:04ZengWileyActive and Passive Electronic Components0882-75161563-50311983-01-01102-315716210.1155/APEC.10.157Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina SubstratesC. ThebaultR. SchnitzlerJ. P. Ramyhttp://dx.doi.org/10.1155/APEC.10.157 |
spellingShingle | C. Thebault R. Schnitzler J. P. Ramy Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates Active and Passive Electronic Components |
title | Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates |
title_full | Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates |
title_fullStr | Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates |
title_full_unstemmed | Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates |
title_short | Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates |
title_sort | experimental and theoretical characterization of thick and thin films for microwave uses on 99 6 37 alumina substrates |
url | http://dx.doi.org/10.1155/APEC.10.157 |
work_keys_str_mv | AT cthebault experimentalandtheoreticalcharacterizationofthickandthinfilmsformicrowaveuseson99637aluminasubstrates AT rschnitzler experimentalandtheoreticalcharacterizationofthickandthinfilmsformicrowaveuseson99637aluminasubstrates AT jpramy experimentalandtheoreticalcharacterizationofthickandthinfilmsformicrowaveuseson99637aluminasubstrates |