APA (7th ed.) Citation

Thebault, C., Schnitzler, R., & Ramy, J. P. Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates. Wiley.

Chicago Style (17th ed.) Citation

Thebault, C., R. Schnitzler, and J. P. Ramy. Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates. Wiley.

MLA (9th ed.) Citation

Thebault, C., et al. Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates. Wiley.