Machine Learning-Based Modeling of Hot Carrier Injection in 40 nm CMOS Transistors

Machine Learning-Based Modeling of Hot Carrier Injection in 40 nm CMOS Transistors

This paper presents a machine-learning-based approach for the degradation modeling of hot carrier injection in metal-oxide-semiconductor field-effect transistors (MOSFETs). Stress measurement data have been employed at various stress conditions of both n- and p-MOSFETs with different channel geometr...

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Bibliographic Details
Main Authors: Xhesila Xhafa, Ali Dogus Gungordu, Mustafa Berke Yelten
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Reliability
hot carrier injection
HCI
machine learning
ML
Gaussian process regressions
Online Access:https://ieeexplore.ieee.org/document/10477498/
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