APA (7th ed.) Citation

Balasubramanian, C., Radhakrishnan, M., & Narayandas, K. Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance. Wiley.

Chicago Style (17th ed.) Citation

Balasubramanian, C., M. Radhakrishnan, and K. Narayandas. Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance. Wiley.

MLA (9th ed.) Citation

Balasubramanian, C., et al. Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance. Wiley.