A Survey on the Modeling of Magnetic Tunnel Junctions for Circuit Simulation
Spin-transfer torque-based magnetoresistive random access memory (STT-MRAM) is a promising candidate for universal memory that may replace traditional memory forms. It is expected to provide high-speed operation, scalability, low-power dissipation, and high endurance. MRAM switching technology has e...
Saved in:
Main Authors: | Hyein Lim, Seungjun Lee, Hyungsoon Shin |
---|---|
Format: | Article |
Language: | English |
Published: |
Wiley
2016-01-01
|
Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/2016/3858621 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Modelling of Dual-Junction Solar Cells including Tunnel Junction
by: Abdelaziz Amine, et al.
Published: (2013-01-01) -
High Speed Non-Linear Circuit
Simulation of Bipolar Junction
Transistors
by: M. N. Doja, et al.
Published: (1999-01-01) -
Bolometric Properties of a Spin-Torque Diode Based on a Magnetic Tunnel Junction
by: G. D. Demin, et al.
Published: (2019-01-01) -
Research on Equivalent Circuit Model of HVDC Valve and Calculation of Thyristor Junction Temperature
by: Wei Yao, et al.
Published: (2024-01-01) -
Dynamic Model of MR Dampers Based on a Hysteretic Magnetic Circuit
by: Pengfei Guo, et al.
Published: (2018-01-01)