Aslam, M., Chang, S., Chuang, M., Chen, Y., Lee, Y., & Li, Y. Temperature-Dependent Hydrogen Modulations of Ultra-Scaled a-IGZO Thin Film Transistor Under Gate Bias Stress. IEEE.
Chicago Style (17th ed.) CitationAslam, Muhammad, Shu-Wei Chang, Min-Hui Chuang, Yi-Ho Chen, Yao-Jen Lee, and Yiming Li. Temperature-Dependent Hydrogen Modulations of Ultra-Scaled A-IGZO Thin Film Transistor Under Gate Bias Stress. IEEE.
MLA (9th ed.) CitationAslam, Muhammad, et al. Temperature-Dependent Hydrogen Modulations of Ultra-Scaled A-IGZO Thin Film Transistor Under Gate Bias Stress. IEEE.
Warning: These citations may not always be 100% accurate.