A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing
Integrated circuits that pass testing still have quality differences, thus making grading necessary. Traditional grading methods rely on static testing and electrical measurements, which are challenging to achieve precise grading, time-consuming, and costly. A new grading method based on the failure...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-02-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/15/4/2009 |
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