Immittance Spectroscopy of Smart Components and Novel Devices

AC small-signal immittance spectroscopy is employed as a viable tool to demonstrate electrical characterization, performance improvement, and quality assurance issues of smart materials-based components and novel devices. The variation in the ac response, complemented via dc measurements within a ra...

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Main Authors: Mohammad A. Alim, Sanjida Khanam, Martin A. Seitz
Format: Article
Language:English
Published: Wiley 1994-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/1994/25820
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author Mohammad A. Alim
Sanjida Khanam
Martin A. Seitz
author_facet Mohammad A. Alim
Sanjida Khanam
Martin A. Seitz
author_sort Mohammad A. Alim
collection DOAJ
description AC small-signal immittance spectroscopy is employed as a viable tool to demonstrate electrical characterization, performance improvement, and quality assurance issues of smart materials-based components and novel devices. The variation in the ac response, complemented via dc measurements within a range of tolerating temperature, delineates competing phenomena occurring in the microstructures of these engineering material systems. The results are presented in a generic manner with possible explanations on the mechanisms for two selected Debye-like (nearly ideal) and non-Debye (non-ideal) low-capacitance resistors. This spectroscopic approach allows systematic development of a representative equivalent circuit, considered to be the characteristic of the devices and components, for specific applications.
format Article
id doaj-art-32576dd27f654f7c8d6c84b1d6c60191
institution Kabale University
issn 0882-7516
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language English
publishDate 1994-01-01
publisher Wiley
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series Active and Passive Electronic Components
spelling doaj-art-32576dd27f654f7c8d6c84b1d6c601912025-02-03T06:48:35ZengWileyActive and Passive Electronic Components0882-75161563-50311994-01-01163-415317010.1155/1994/25820Immittance Spectroscopy of Smart Components and Novel DevicesMohammad A. Alim0Sanjida Khanam1Martin A. Seitz2Hubbell Incorporated, The Ohio Brass Company, 8711 Wadsworth Road, Wadsworth, Ohio 44281, USACollege of Engineering, Marquette University, Milwaukee, Wisconsin 53233, USACollege of Engineering, Marquette University, Milwaukee, Wisconsin 53233, USAAC small-signal immittance spectroscopy is employed as a viable tool to demonstrate electrical characterization, performance improvement, and quality assurance issues of smart materials-based components and novel devices. The variation in the ac response, complemented via dc measurements within a range of tolerating temperature, delineates competing phenomena occurring in the microstructures of these engineering material systems. The results are presented in a generic manner with possible explanations on the mechanisms for two selected Debye-like (nearly ideal) and non-Debye (non-ideal) low-capacitance resistors. This spectroscopic approach allows systematic development of a representative equivalent circuit, considered to be the characteristic of the devices and components, for specific applications.http://dx.doi.org/10.1155/1994/25820
spellingShingle Mohammad A. Alim
Sanjida Khanam
Martin A. Seitz
Immittance Spectroscopy of Smart Components and Novel Devices
Active and Passive Electronic Components
title Immittance Spectroscopy of Smart Components and Novel Devices
title_full Immittance Spectroscopy of Smart Components and Novel Devices
title_fullStr Immittance Spectroscopy of Smart Components and Novel Devices
title_full_unstemmed Immittance Spectroscopy of Smart Components and Novel Devices
title_short Immittance Spectroscopy of Smart Components and Novel Devices
title_sort immittance spectroscopy of smart components and novel devices
url http://dx.doi.org/10.1155/1994/25820
work_keys_str_mv AT mohammadaalim immittancespectroscopyofsmartcomponentsandnoveldevices
AT sanjidakhanam immittancespectroscopyofsmartcomponentsandnoveldevices
AT martinaseitz immittancespectroscopyofsmartcomponentsandnoveldevices