UHV – Deposited Amorphous Tantalum and Tantalum–Nickel Films

UHV – Deposited Amorphous Tantalum and Tantalum–Nickel Films

Saved in:

Bibliographic Details
Main Authors:	G&#252;nther Menzel, Alfred Sch&#228;fer
Format:	Article
Language:	English
Published:	Wiley 1977-01-01
Series:	Active and Passive Electronic Components
Online Access:	http://dx.doi.org/10.1155/APEC.4.29
Tags:	Add Tag No Tags, Be the first to tag this record!

Similar Items

Influence of Electrolytes in the Electrical Characteristics of Anodic Films on Tantalum
by: J. M. Mart&#237;nez-Duart, et al.
Published: (1981-01-01)

Properties of Nickel Films Prepared by R.F. Sputtering and Interdiffusion Analysis of Ta2N–Ni Films
by: G. Morillot, et al.
Published: (1980-01-01)

Low Frequency Characteristics of TiO2(Rutile)–Glass Thick Films
by: B. Rzasa, et al.
Published: (1977-01-01)

Tantalum Thin Film Capacitors With Various Types of Counterelectrodes
by: R. May, et al.
Published: (1980-01-01)

Failure Mechanisms in Wet Tantalum Capacitors
by: D. Hayward
Published: (1976-01-01)

Failure Mechanism of Solid Tantalum Capacitors
by: F. J. J. Driesens, et al.
Published: (1976-01-01)

Fabrication and mechanical properties of porous tantalum carbon composites by chemical vapor deposition
by: Junyu Zhu, et al.
Published: (2025-01-01)

Tantalum airbridges for scalable superconducting quantum processors
by: Kunliang Bu, et al.
Published: (2025-01-01)

Comparison of Quadratic– and Median-Based Roughness Penalties for Penalized-Likelihood Sinogram Restoration in Computed Tomography
Published: (2006-01-01)

THE QUALITY CONTROL OF ELECTROLYTIC TANTALUM CAPACITORS BY USING THE STRESS TEST
by: P. L. Kuznetsov, et al.
Published: (2015-08-01)

Subtrochanteric Fracture following Removal of a Porous Tantalum Implant
by: Derek F. Amanatullah, et al.
Published: (2013-01-01)

Athermal Tantalum Pentoxide Mach-Zehnder Interferometers Based on Structural Compensation Method
by: Mingjian You, et al.
Published: (2025-01-01)

Abnormal Capacitance Increasing at Elevated Temperature in Tantalum Capacitors with PEDOT:PSS Electrodes
by: Qifeng Pan, et al.
Published: (2018-01-01)

Research on Numerical Simulation of Tantalum Explosively Formed Projectile Forming Driven by Detonation
by: Yajun Wang, et al.
Published: (2022-01-01)

Acetabular Reconstruction Using Multiple Porous Tantalum Augments: Three-Quarter Football Augment
by: C. H. Ansorge, et al.
Published: (2022-01-01)

New Thick Film Sensors
by: S. Lepp&#228;vuori
Published: (1980-01-01)

New Crossovers Using a Combined Film Technique
by: G&#252;nter Kiessling
Published: (1979-01-01)

Effect of Firing Temperature and Glass Content on the Electrical Properties of Thick Film Capacitors
by: A. Uusim&#228;ki, et al.
Published: (1982-01-01)

Synthetic Conditions and Color Characteristics of Tantalum Oxynitride Prepared via Liquid-NH3 Process
by: Yo Sasaki, et al.
Published: (2009-01-01)

Dynamic Response of Graphitic Targets with Tantalum Cores Impacted by Pulsed 440-GeV Proton Beams
by: Pascal Simon, et al.
Published: (2021-01-01)

Increased Frequency of Pre–Pro B Cells in the Bone Marrow of New Zealand Black (NZB) Mice: Implications for aDevelopmental Block in B Cell Differentiation
by: Zhe-Xiong Lian, et al.
Published: (2002-01-01)

XPS and GDOES Characterization of Porous Coating Enriched with Copper and Calcium Obtained on Tantalum via Plasma Electrolytic Oxidation
by: Krzysztof Rokosz, et al.
Published: (2016-01-01)

Utilization of Sanitized Human Excreta and Wood Ash for Establishing Multipurpose <i>Ficus Thonningii</i> Blume in a Degraded Tantalum Technosol
by: D. Neina
Published: (2020-01-01)

Utilization of Sanitized Human Excreta and Wood Ash for Establishing Multipurpose <i>Ficus Thonningii</i> Blume in a Degraded Tantalum Technosol
by: D. Neina
Published: (2020-01-01)

Structural and Optical Properties of Amorphous Al2O3 Thin Film Deposited by Atomic Layer Deposition
by: Shuzheng Shi, et al.
Published: (2018-01-01)

The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
by: P. Tr&#228;gner
Published: (1984-01-01)

γ/δ Cells in Fetal, Neonatal, and Adult RatLymphoid Organs
by: P. K&#252;hnlein, et al.
Published: (1995-01-01)

The Influence of Filter Parameters on the Response of Ceramic Filters Operating in the Thickness-Twist Mode
by: P. Ruuska, et al.
Published: (1981-01-01)

Review of Digital Construction of UHV Projects Based on Building Information Modeling Technology
by: QI Lizhong, LIU Ding, ZHANG Zhuoqun, XIE Rongzhen, RONG Jingguo, ZHANG Su, YUAN Bo, SUN Yi
Published: (2025-02-01)

Multibody Modeling Method for UHV Porcelain Arresters Equipped with Lead Alloy Isolation Device
by: Xiaochao Su, et al.
Published: (2021-01-01)

Ceramic on Metal Substrates Produced by Plasma Spraying for Thick Film Technology
by: Lech Paw&#322;owski, et al.
Published: (1983-01-01)

The Use of Hybrid Microelectronics in the Construction of Ion-Selective Electrodes
by: P. S. Romppainen, et al.
Published: (1983-01-01)

Screening for PPAR Responsive Regulatory Modules in Cancer
by: Merja Hein&#228;niemi, et al.
Published: (2008-01-01)

Examination of Thick-Films Using Modern Surface Analytical Techniques
by: G. Ripka, et al.
Published: (1984-01-01)

TiNx Thin-Film Resistors for Hybrid Integrated Circuits
by: W. Posadowski, et al.
Published: (1980-01-01)

Allowable Power in NiCr Film Resistors
by: E. Proci&#243;w, et al.
Published: (1982-01-01)

A MultiModal Detection Method for UHV Substation Faults Based on Robot Inspection and Deep Learning
by: Rong Meng, et al.
Published: (2022-01-01)

Heterogeneous integration of amorphous silicon carbide on thin film lithium niobate
by: Zizheng Li, et al.
Published: (2025-01-01)

Electrical Properties of Amorphous Titanium Oxide Thin Films for Bolometric Application
by: Yongfeng Ju, et al.
Published: (2013-01-01)

Comparison of Arc Erosive and Laser Beam Trimming of Thin Film Resistors
by: Zs. Illyefalvi-Vit&#233;z
Published: (1977-01-01)