Time Dependence of Ion-Migration Effects in NiCr Resistor Films

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Bibliographic Details
Main Authors: R. Hoffmann, U. Smith
Format: Article
Language:English
Published: Wiley 1978-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.5.159
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author R. Hoffmann
U. Smith
author_facet R. Hoffmann
U. Smith
author_sort R. Hoffmann
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institution Kabale University
issn 0882-7516
1563-5031
language English
publishDate 1978-01-01
publisher Wiley
record_format Article
series Active and Passive Electronic Components
spelling doaj-art-2e81d94f43754a258ea7ffabf451d84c2025-02-03T05:46:28ZengWileyActive and Passive Electronic Components0882-75161563-50311978-01-015315916410.1155/APEC.5.159Time Dependence of Ion-Migration Effects in NiCr Resistor FilmsR. HoffmannU. Smithhttp://dx.doi.org/10.1155/APEC.5.159
spellingShingle R. Hoffmann
U. Smith
Time Dependence of Ion-Migration Effects in NiCr Resistor Films
Active and Passive Electronic Components
title Time Dependence of Ion-Migration Effects in NiCr Resistor Films
title_full Time Dependence of Ion-Migration Effects in NiCr Resistor Films
title_fullStr Time Dependence of Ion-Migration Effects in NiCr Resistor Films
title_full_unstemmed Time Dependence of Ion-Migration Effects in NiCr Resistor Films
title_short Time Dependence of Ion-Migration Effects in NiCr Resistor Films
title_sort time dependence of ion migration effects in nicr resistor films
url http://dx.doi.org/10.1155/APEC.5.159
work_keys_str_mv AT rhoffmann timedependenceofionmigrationeffectsinnicrresistorfilms
AT usmith timedependenceofionmigrationeffectsinnicrresistorfilms