A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge Waveguide
Potential applications of microwave energy, a developed form of clean energy, are diverse and extensive. To expand the applications of microwave heating in the metallurgical field, it is essential to obtain the permittivity of ores throughout the heating process. This paper presents the design of a...
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| Language: | English |
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MDPI AG
2025-01-01
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| Online Access: | https://www.mdpi.com/1424-8220/25/2/541 |
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| author | Rui Xiong Yuanhang Hu Anqi Xia Kama Huang Liping Yan Qian Chen |
| author_facet | Rui Xiong Yuanhang Hu Anqi Xia Kama Huang Liping Yan Qian Chen |
| author_sort | Rui Xiong |
| collection | DOAJ |
| description | Potential applications of microwave energy, a developed form of clean energy, are diverse and extensive. To expand the applications of microwave heating in the metallurgical field, it is essential to obtain the permittivity of ores throughout the heating process. This paper presents the design of a 2.45 GHz ridge waveguide apparatus based on the transmission/reflection method to measure permittivity, which constitutes a system capable of measuring the complex relative permittivity of the material under test with a wide temperature range from room temperature up to 1100 °C. The experimental results indicate that the system is capable of performing rapid measurements during the heating process. Furthermore, the system is capable of accurately measuring dielectric properties when the real part of the permittivity and the loss tangent vary widely. This measurement system is suitable for high-temperature dielectric property measurements and has potential applications in microwave-assisted metallurgy. |
| format | Article |
| id | doaj-art-2dec6c0443ad40ddb2f49733daff339a |
| institution | Kabale University |
| issn | 1424-8220 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | MDPI AG |
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| series | Sensors |
| spelling | doaj-art-2dec6c0443ad40ddb2f49733daff339a2025-01-24T13:49:17ZengMDPI AGSensors1424-82202025-01-0125254110.3390/s25020541A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge WaveguideRui Xiong0Yuanhang Hu1Anqi Xia2Kama Huang3Liping Yan4Qian Chen5School of Electronics and Information Engineering, Sichuan University, Chengdu 610064, ChinaSchool of Electronics and Information Engineering, Sichuan University, Chengdu 610064, ChinaSchool of Electronics and Information Engineering, Sichuan University, Chengdu 610064, ChinaSchool of Electronics and Information Engineering, Sichuan University, Chengdu 610064, ChinaSchool of Electronics and Information Engineering, Sichuan University, Chengdu 610064, ChinaSchool of Electronics and Information Engineering, Sichuan University, Chengdu 610064, ChinaPotential applications of microwave energy, a developed form of clean energy, are diverse and extensive. To expand the applications of microwave heating in the metallurgical field, it is essential to obtain the permittivity of ores throughout the heating process. This paper presents the design of a 2.45 GHz ridge waveguide apparatus based on the transmission/reflection method to measure permittivity, which constitutes a system capable of measuring the complex relative permittivity of the material under test with a wide temperature range from room temperature up to 1100 °C. The experimental results indicate that the system is capable of performing rapid measurements during the heating process. Furthermore, the system is capable of accurately measuring dielectric properties when the real part of the permittivity and the loss tangent vary widely. This measurement system is suitable for high-temperature dielectric property measurements and has potential applications in microwave-assisted metallurgy.https://www.mdpi.com/1424-8220/25/2/541ridge waveguidecomplex relative permittivityartificial neural networkscattering parametersmicrowave measurement |
| spellingShingle | Rui Xiong Yuanhang Hu Anqi Xia Kama Huang Liping Yan Qian Chen A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge Waveguide Sensors ridge waveguide complex relative permittivity artificial neural network scattering parameters microwave measurement |
| title | A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge Waveguide |
| title_full | A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge Waveguide |
| title_fullStr | A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge Waveguide |
| title_full_unstemmed | A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge Waveguide |
| title_short | A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge Waveguide |
| title_sort | high temperature and wide permittivity range measurement system based on ridge waveguide |
| topic | ridge waveguide complex relative permittivity artificial neural network scattering parameters microwave measurement |
| url | https://www.mdpi.com/1424-8220/25/2/541 |
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