Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light

Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light

Abstract New experimental methods with high out‐of‐plane spatial sensitivity combined with ultrafast temporal resolution can revolutionize the understanding of charge‐ and heat‐transfer dynamics occurring at interfaces. In this work, a step forward is taken in this direction by applying coherence to...

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Bibliographic Details
Main Authors: Felix Wiesner, Johann J. Abel, Muhammad Hussain, Vipin Krishna, Alisson R. Cadore, Juan P. G. Felipe, Ana M. Valencia, Martin Wünsche, Julius Reinhard, Marco Gruenewald, Caterina Cocchi, Gerhard G. Paulus, Giancarlo Soavi, Silvio Fuchs
Format: Article
Language:English
Published: Wiley-VCH 2025-02-01
Series:Advanced Materials Interfaces
Subjects:
DFT
extreme ultraviolet
EUV
layered heterostructures
optical coherence tomography
Online Access:https://doi.org/10.1002/admi.202400534
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