Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light
Abstract New experimental methods with high out‐of‐plane spatial sensitivity combined with ultrafast temporal resolution can revolutionize the understanding of charge‐ and heat‐transfer dynamics occurring at interfaces. In this work, a step forward is taken in this direction by applying coherence to...
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| Format: | Article |
| Language: | English |
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Wiley-VCH
2025-02-01
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| Series: | Advanced Materials Interfaces |
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| Online Access: | https://doi.org/10.1002/admi.202400534 |
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| author | Felix Wiesner Johann J. Abel Muhammad Hussain Vipin Krishna Alisson R. Cadore Juan P. G. Felipe Ana M. Valencia Martin Wünsche Julius Reinhard Marco Gruenewald Caterina Cocchi Gerhard G. Paulus Giancarlo Soavi Silvio Fuchs |
| author_facet | Felix Wiesner Johann J. Abel Muhammad Hussain Vipin Krishna Alisson R. Cadore Juan P. G. Felipe Ana M. Valencia Martin Wünsche Julius Reinhard Marco Gruenewald Caterina Cocchi Gerhard G. Paulus Giancarlo Soavi Silvio Fuchs |
| author_sort | Felix Wiesner |
| collection | DOAJ |
| description | Abstract New experimental methods with high out‐of‐plane spatial sensitivity combined with ultrafast temporal resolution can revolutionize the understanding of charge‐ and heat‐transfer dynamics occurring at interfaces. In this work, a step forward is taken in this direction by applying coherence tomography with extreme ultraviolet (EUV) light to different van der Waals heterostructures, which enables a 3D sample reconstruction with nanoscopic axial resolution. Furthermore, the measurements and, more in general, the approach is confirmed by ab initio calculations of the refractive index of layered materials that we compare to existing databases of empirical data. The EUV coherence tomography contrast is estimated in a broad spectral range (photon energy 65 –100 eV). This work sets the basis for the development of a new spectroscopy tool that, thanks to the temporal profile of EUV light sources and the high axial resolution of coherence tomography, can become the ideal probe of ultrafast processes occurring in van der Waals heterostructures and buried nanoscale opto‐electronic devices. |
| format | Article |
| id | doaj-art-2dddea7ba0cb48fa943f18bedb1c5370 |
| institution | Kabale University |
| issn | 2196-7350 |
| language | English |
| publishDate | 2025-02-01 |
| publisher | Wiley-VCH |
| record_format | Article |
| series | Advanced Materials Interfaces |
| spelling | doaj-art-2dddea7ba0cb48fa943f18bedb1c53702025-02-03T13:24:06ZengWiley-VCHAdvanced Materials Interfaces2196-73502025-02-01123n/an/a10.1002/admi.202400534Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet LightFelix Wiesner0Johann J. Abel1Muhammad Hussain2Vipin Krishna3Alisson R. Cadore4Juan P. G. Felipe5Ana M. Valencia6Martin Wünsche7Julius Reinhard8Marco Gruenewald9Caterina Cocchi10Gerhard G. Paulus11Giancarlo Soavi12Silvio Fuchs13Institute of Optics and Quantum Electronics Friedrich Schiller University Jena Max‐Wien‐Platz 1 07743 Jena GermanyInstitute of Optics and Quantum Electronics Friedrich Schiller University Jena Max‐Wien‐Platz 1 07743 Jena GermanyInstitute of Solid State Physics Friedrich Schiller University Jena Helmholtzweg 5 07743 Jena GermanyInstitute of Solid State Physics Friedrich Schiller University Jena Helmholtzweg 5 07743 Jena GermanyBrazilian Nanotechnology National Laboratory (LNNano) Brazilian Center for Research in Energy and Materials (CNPEM) Campinas–SP 13083‐100 BrazilPhysics Department and IRIS Adlershof Humboldt‐Universität zu Berlin 12489 Berlin GermanyPhysics Department and IRIS Adlershof Humboldt‐Universität zu Berlin 12489 Berlin GermanyInstitute of Optics and Quantum Electronics Friedrich Schiller University Jena Max‐Wien‐Platz 1 07743 Jena GermanyInstitute of Optics and Quantum Electronics Friedrich Schiller University Jena Max‐Wien‐Platz 1 07743 Jena GermanyInstitute of Solid State Physics Friedrich Schiller University Jena Helmholtzweg 5 07743 Jena GermanyPhysics Department and IRIS Adlershof Humboldt‐Universität zu Berlin 12489 Berlin GermanyInstitute of Optics and Quantum Electronics Friedrich Schiller University Jena Max‐Wien‐Platz 1 07743 Jena GermanyInstitute of Solid State Physics Friedrich Schiller University Jena Helmholtzweg 5 07743 Jena GermanyInstitute of Optics and Quantum Electronics Friedrich Schiller University Jena Max‐Wien‐Platz 1 07743 Jena GermanyAbstract New experimental methods with high out‐of‐plane spatial sensitivity combined with ultrafast temporal resolution can revolutionize the understanding of charge‐ and heat‐transfer dynamics occurring at interfaces. In this work, a step forward is taken in this direction by applying coherence tomography with extreme ultraviolet (EUV) light to different van der Waals heterostructures, which enables a 3D sample reconstruction with nanoscopic axial resolution. Furthermore, the measurements and, more in general, the approach is confirmed by ab initio calculations of the refractive index of layered materials that we compare to existing databases of empirical data. The EUV coherence tomography contrast is estimated in a broad spectral range (photon energy 65 –100 eV). This work sets the basis for the development of a new spectroscopy tool that, thanks to the temporal profile of EUV light sources and the high axial resolution of coherence tomography, can become the ideal probe of ultrafast processes occurring in van der Waals heterostructures and buried nanoscale opto‐electronic devices.https://doi.org/10.1002/admi.202400534DFTextreme ultravioletEUVlayered heterostructuresoptical coherence tomography |
| spellingShingle | Felix Wiesner Johann J. Abel Muhammad Hussain Vipin Krishna Alisson R. Cadore Juan P. G. Felipe Ana M. Valencia Martin Wünsche Julius Reinhard Marco Gruenewald Caterina Cocchi Gerhard G. Paulus Giancarlo Soavi Silvio Fuchs Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light Advanced Materials Interfaces DFT extreme ultraviolet EUV layered heterostructures optical coherence tomography |
| title | Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light |
| title_full | Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light |
| title_fullStr | Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light |
| title_full_unstemmed | Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light |
| title_short | Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light |
| title_sort | optical coherence tomography of van der waals heterostructures using extreme ultraviolet light |
| topic | DFT extreme ultraviolet EUV layered heterostructures optical coherence tomography |
| url | https://doi.org/10.1002/admi.202400534 |
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