Defect Complexes in CrSBr Revealed Through Electron Microscopy and Deep Learning

Defect Complexes in CrSBr Revealed Through Electron Microscopy and Deep Learning

Atomic defects underpin the properties of van der Waals materials, and their understanding is essential for advancing quantum and energy technologies. Scanning transmission electron microscopy is a powerful tool for defect identification in atomically thin materials, and extending it to multilayer a...

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Bibliographic Details
Main Authors: Mads Weile, Sergii Grytsiuk, Aubrey Penn, Daniel G. Chica, Xavier Roy, Kseniia Mosina, Zdenek Sofer, Jakob Schiøtz, Stig Helveg, Malte Rösner, Frances M. Ross, Julian Klein
Format: Article
Language:English
Published: American Physical Society 2025-06-01
Series:Physical Review X
Online Access:http://doi.org/10.1103/PhysRevX.15.021080
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