Defect Detection Method for Large-Curvature and Highly Reflective Surfaces Based on Polarization Imaging and Improved YOLOv11
In industrial manufacturing, product quality is of paramount importance, as surface defects not only compromise product appearance but may also lead to functional failures, resulting in substantial economic losses. Detecting defects on complex surfaces remains a significant challenge due to the vari...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-04-01
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| Series: | Photonics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2304-6732/12/4/368 |
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