Yu, Z., Wang, D., & Wu, H. Defect Detection Method for Large-Curvature and Highly Reflective Surfaces Based on Polarization Imaging and Improved YOLOv11. MDPI AG.
Chicago Style (17th ed.) CitationYu, Zeyu, Dongyun Wang, and Hanyang Wu. Defect Detection Method for Large-Curvature and Highly Reflective Surfaces Based on Polarization Imaging and Improved YOLOv11. MDPI AG.
MLA (9th ed.) CitationYu, Zeyu, et al. Defect Detection Method for Large-Curvature and Highly Reflective Surfaces Based on Polarization Imaging and Improved YOLOv11. MDPI AG.
Warning: These citations may not always be 100% accurate.