RST-YOLOv8: An Improved Chip Surface Defect Detection Model Based on YOLOv8
Surface defect detection in chips is crucial for ensuring product quality and reliability. This paper addresses the challenge of low identification accuracy in chip surface defect detection, which arises from the similarity of defect characteristics, small sizes, and significant scale differences. W...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-06-01
|
| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/25/13/3859 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|