A Scalable Isolated Gate Driver With Programmable Frequency and Duty Cycle for Series-Connected SiC MOSFETs

To enhance the voltage-handling capability of a switch, the series connection of switching devices is a cost-effective method that preserves many advantages of mature low-voltage devices. Dynamic voltage imbalance and electrical isolation for the devices at the high voltage (HV) side are two importa...

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Main Authors: Sohrab Ghafoor, Mahesh Kulkarni, Reza Mirzadarani, Peter Vaessen, Mohamad Ghaffarian Niasar
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Open Journal of the Industrial Electronics Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10812009/
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author Sohrab Ghafoor
Mahesh Kulkarni
Reza Mirzadarani
Peter Vaessen
Mohamad Ghaffarian Niasar
author_facet Sohrab Ghafoor
Mahesh Kulkarni
Reza Mirzadarani
Peter Vaessen
Mohamad Ghaffarian Niasar
author_sort Sohrab Ghafoor
collection DOAJ
description To enhance the voltage-handling capability of a switch, the series connection of switching devices is a cost-effective method that preserves many advantages of mature low-voltage devices. Dynamic voltage imbalance and electrical isolation for the devices at the high voltage (HV) side are two important challenges associated with series connection topology. Transformer-coupled gate drivers are excellent for providing both dynamic voltage balance and high galvanic isolation. However, they can only provide the switching function at the transformer pulse frequency. To generate complex waveforms of future power-electronics-dominated grids, a switch with user-defined turn-<sc>on&#x002F;off</sc> timing is required for testing grid assets under high-voltage conditions. This article presents a simple, cost-effective open-loop gate driver that overcomes this limitation by introducing two sets of complementary pulse transformers to initialize programmable frequency and duty cycle. Successful experimental verification of the series-connected SiC <sc>mosfet</sc>s prototype is performed at 3.2 kV at various frequencies and duty cycles. The article also demonstrates that the measurement probes placed across series-connected <sc>mosfet</sc>s significantly affect the voltage distribution and validate a compensation mechanism.
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institution Kabale University
issn 2644-1284
language English
publishDate 2025-01-01
publisher IEEE
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series IEEE Open Journal of the Industrial Electronics Society
spelling doaj-art-264c1633d45142139a9a63fc4d93b8392025-01-30T00:03:57ZengIEEEIEEE Open Journal of the Industrial Electronics Society2644-12842025-01-0169511410.1109/OJIES.2024.352132510812009A Scalable Isolated Gate Driver With Programmable Frequency and Duty Cycle for Series-Connected SiC MOSFETsSohrab Ghafoor0https://orcid.org/0009-0001-4671-3327Mahesh Kulkarni1https://orcid.org/0009-0008-9608-5243Reza Mirzadarani2https://orcid.org/0000-0002-9491-1926Peter Vaessen3Mohamad Ghaffarian Niasar4https://orcid.org/0000-0003-1766-8077Delft University of Technology, Delft, The NetherlandsDelft University of Technology, Delft, The NetherlandsDelft University of Technology, Delft, The NetherlandsDelft University of Technology, Delft, The NetherlandsDelft University of Technology, Delft, The NetherlandsTo enhance the voltage-handling capability of a switch, the series connection of switching devices is a cost-effective method that preserves many advantages of mature low-voltage devices. Dynamic voltage imbalance and electrical isolation for the devices at the high voltage (HV) side are two important challenges associated with series connection topology. Transformer-coupled gate drivers are excellent for providing both dynamic voltage balance and high galvanic isolation. However, they can only provide the switching function at the transformer pulse frequency. To generate complex waveforms of future power-electronics-dominated grids, a switch with user-defined turn-<sc>on&#x002F;off</sc> timing is required for testing grid assets under high-voltage conditions. This article presents a simple, cost-effective open-loop gate driver that overcomes this limitation by introducing two sets of complementary pulse transformers to initialize programmable frequency and duty cycle. Successful experimental verification of the series-connected SiC <sc>mosfet</sc>s prototype is performed at 3.2 kV at various frequencies and duty cycles. The article also demonstrates that the measurement probes placed across series-connected <sc>mosfet</sc>s significantly affect the voltage distribution and validate a compensation mechanism.https://ieeexplore.ieee.org/document/10812009/High-voltage switchhigh-voltage testingisolated gate drivermedium-voltage (MV) dc applicationsseries-connected SiC MOSFETsvoltage balancing
spellingShingle Sohrab Ghafoor
Mahesh Kulkarni
Reza Mirzadarani
Peter Vaessen
Mohamad Ghaffarian Niasar
A Scalable Isolated Gate Driver With Programmable Frequency and Duty Cycle for Series-Connected SiC MOSFETs
IEEE Open Journal of the Industrial Electronics Society
High-voltage switch
high-voltage testing
isolated gate driver
medium-voltage (MV) dc applications
series-connected SiC MOSFETs
voltage balancing
title A Scalable Isolated Gate Driver With Programmable Frequency and Duty Cycle for Series-Connected SiC MOSFETs
title_full A Scalable Isolated Gate Driver With Programmable Frequency and Duty Cycle for Series-Connected SiC MOSFETs
title_fullStr A Scalable Isolated Gate Driver With Programmable Frequency and Duty Cycle for Series-Connected SiC MOSFETs
title_full_unstemmed A Scalable Isolated Gate Driver With Programmable Frequency and Duty Cycle for Series-Connected SiC MOSFETs
title_short A Scalable Isolated Gate Driver With Programmable Frequency and Duty Cycle for Series-Connected SiC MOSFETs
title_sort scalable isolated gate driver with programmable frequency and duty cycle for series connected sic mosfets
topic High-voltage switch
high-voltage testing
isolated gate driver
medium-voltage (MV) dc applications
series-connected SiC MOSFETs
voltage balancing
url https://ieeexplore.ieee.org/document/10812009/
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