CCD Standard Curve Fitting for Microarray Detection Base on Multi-Layer Perceptron
The Charge Coupled Device (CCD) scanner determines the concentration of the microarray by capturing the intensity of the fluorescent signal on the microarray in combination with the standard curve. Due to the characteristics of semiconductors, the CCD sensor in the scanner we designed suffers from s...
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| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10551909/ |
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