Surface Quality Monitoring and Improvement for Dimensional Metrology in Inline CT by Denoising with Neural Networks and Fast Surface Quality Metric
Inline computed tomography (CT) is becoming increasingly important for 100% inspection in production technology. However, the short machine cycle times—often just a few minutes—require either fewer X-ray projections or shorter detector exposure times, significantly reducing photon counts by one to...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | deu |
| Published: |
NDT.net
2025-02-01
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| Series: | e-Journal of Nondestructive Testing |
| Online Access: | https://www.ndt.net/search/docs.php3?id=30723 |
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