Lin, J., & Wang, B. Room-Temperature Voltage Stressing Effects on Resistive Switching of Conductive-Bridging RAM Cells with Cu-Doped SiO2 Films. Wiley.
Chicago Style (17th ed.) CitationLin, Jian-Yang, and Bing-Xun Wang. Room-Temperature Voltage Stressing Effects on Resistive Switching of Conductive-Bridging RAM Cells with Cu-Doped SiO2 Films. Wiley.
MLA (9th ed.) CitationLin, Jian-Yang, and Bing-Xun Wang. Room-Temperature Voltage Stressing Effects on Resistive Switching of Conductive-Bridging RAM Cells with Cu-Doped SiO2 Films. Wiley.
Warning: These citations may not always be 100% accurate.