Examination of Thick-Films Using Modern Surface Analytical Techniques
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| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
1984-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/APEC.11.219 |
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| _version_ | 1832554409554345984 |
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| author | G. Ripka G. Harsányi |
| author_facet | G. Ripka G. Harsányi |
| author_sort | G. Ripka |
| collection | DOAJ |
| format | Article |
| id | doaj-art-21d1fdab55b34f9f9dad180d3f3a6bab |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 1984-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-21d1fdab55b34f9f9dad180d3f3a6bab2025-02-03T05:51:28ZengWileyActive and Passive Electronic Components0882-75161563-50311984-01-0111321922310.1155/APEC.11.219Examination of Thick-Films Using Modern Surface Analytical TechniquesG. RipkaG. Harsányihttp://dx.doi.org/10.1155/APEC.11.219 |
| spellingShingle | G. Ripka G. Harsányi Examination of Thick-Films Using Modern Surface Analytical Techniques Active and Passive Electronic Components |
| title | Examination of Thick-Films Using Modern Surface Analytical Techniques |
| title_full | Examination of Thick-Films Using Modern Surface Analytical Techniques |
| title_fullStr | Examination of Thick-Films Using Modern Surface Analytical Techniques |
| title_full_unstemmed | Examination of Thick-Films Using Modern Surface Analytical Techniques |
| title_short | Examination of Thick-Films Using Modern Surface Analytical Techniques |
| title_sort | examination of thick films using modern surface analytical techniques |
| url | http://dx.doi.org/10.1155/APEC.11.219 |
| work_keys_str_mv | AT gripka examinationofthickfilmsusingmodernsurfaceanalyticaltechniques AT gharsamp225nyi examinationofthickfilmsusingmodernsurfaceanalyticaltechniques |