Revealing the Origin and Nature of the Buried Metal‐Substrate Interface Layer in Ta/Sapphire Superconducting Films

Abstract Despite constituting a smaller fraction of the qubit's electromagnetic mode, surfaces and interfaces can exert significant influence as sources of high‐loss tangents, which brings forward the need to reveal properties of these extended defects and identify routes to their control. Here...

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Bibliographic Details
Main Authors:	Aswin k. Anbalagan, Rebecca Cummings, Chenyu Zhou, Junsik Mun, Vesna Stanic, Jean Jordan‐Sweet, Juntao Yao, Kim Kisslinger, Conan Weiland, Dmytro Nykypanchuk, Steven L. Hulbert, Qiang Li, Yimei Zhu, Mingzhao Liu, Peter V. Sushko, Andrew L. Walter, Andi M. Barbour
Format:	Article
Language:	English
Published:	Wiley 2025-05-01
Series:	Advanced Science
Subjects:	density functional theory modeling HAADF‐STEM superconducting films synchrotron X‐ray reflectivity tantalum
Online Access:	https://doi.org/10.1002/advs.202413058
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Revealing the Origin and Nature of the Buried Metal‐Substrate Interface Layer in Ta/Sapphire Superconducting Films

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