Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial films
We epitaxially grew rutile-structured VO _2 films with various out-of-plane lattice constants on (001) TiO _2 substrates by pulsed laser deposition and investigated their protonation by electrochemically injecting protons to the films in transistor structures with gate layers of proton conducting Na...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
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IOP Publishing
2025-01-01
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| Series: | Applied Physics Express |
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| Online Access: | https://doi.org/10.35848/1882-0786/adc8f9 |
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| author | Sota Fuji Yosuke Isoda Xie Lingling Mitsutaka Haruta Takuya Majima Yuichi Shimakawa Daisuke Kan |
| author_facet | Sota Fuji Yosuke Isoda Xie Lingling Mitsutaka Haruta Takuya Majima Yuichi Shimakawa Daisuke Kan |
| author_sort | Sota Fuji |
| collection | DOAJ |
| description | We epitaxially grew rutile-structured VO _2 films with various out-of-plane lattice constants on (001) TiO _2 substrates by pulsed laser deposition and investigated their protonation by electrochemically injecting protons to the films in transistor structures with gate layers of proton conducting Nafion membranes. We found that VO _2 films with out-of-plane lattice expansion are less protonated. On the basis of the experimental results, we discuss the correlation between the out-of-plane lattice expansion and protonation of (001) VO _2 epitaxial films and highlight that reducing lattice defects is key to promoting the protonation of VO _2 films. |
| format | Article |
| id | doaj-art-1ad6c204983548899c2c53eef8f1897c |
| institution | OA Journals |
| issn | 1882-0786 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | Applied Physics Express |
| spelling | doaj-art-1ad6c204983548899c2c53eef8f1897c2025-08-20T02:27:43ZengIOP PublishingApplied Physics Express1882-07862025-01-0118404550110.35848/1882-0786/adc8f9Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial filmsSota Fuji0Yosuke Isoda1https://orcid.org/0000-0003-4445-9908Xie Lingling2Mitsutaka Haruta3https://orcid.org/0000-0002-2237-7242Takuya Majima4https://orcid.org/0000-0003-2804-1915Yuichi Shimakawa5https://orcid.org/0000-0003-1019-2512Daisuke Kan6https://orcid.org/0000-0002-7505-0059Institute for Chemical Research, Kyoto University , Uji, Kyoto 611-0011, JapanInstitute for Chemical Research, Kyoto University , Uji, Kyoto 611-0011, JapanInstitute for Chemical Research, Kyoto University , Uji, Kyoto 611-0011, JapanInstitute for Chemical Research, Kyoto University , Uji, Kyoto 611-0011, JapanDepartment of Nuclear Engineering, Kyoto University , Kyoto 615-8540, JapanInstitute for Chemical Research, Kyoto University , Uji, Kyoto 611-0011, JapanInstitute for Chemical Research, Kyoto University , Uji, Kyoto 611-0011, JapanWe epitaxially grew rutile-structured VO _2 films with various out-of-plane lattice constants on (001) TiO _2 substrates by pulsed laser deposition and investigated their protonation by electrochemically injecting protons to the films in transistor structures with gate layers of proton conducting Nafion membranes. We found that VO _2 films with out-of-plane lattice expansion are less protonated. On the basis of the experimental results, we discuss the correlation between the out-of-plane lattice expansion and protonation of (001) VO _2 epitaxial films and highlight that reducing lattice defects is key to promoting the protonation of VO _2 films.https://doi.org/10.35848/1882-0786/adc8f9protonationVO2epitaxial filmslattice defects |
| spellingShingle | Sota Fuji Yosuke Isoda Xie Lingling Mitsutaka Haruta Takuya Majima Yuichi Shimakawa Daisuke Kan Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial films Applied Physics Express protonation VO2 epitaxial films lattice defects |
| title | Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial films |
| title_full | Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial films |
| title_fullStr | Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial films |
| title_full_unstemmed | Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial films |
| title_short | Correlation between structural properties and electrochemical proton insertion in (001) VO2 epitaxial films |
| title_sort | correlation between structural properties and electrochemical proton insertion in 001 vo2 epitaxial films |
| topic | protonation VO2 epitaxial films lattice defects |
| url | https://doi.org/10.35848/1882-0786/adc8f9 |
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