Zharin, A. L., Mikitsevich, U. A., Svistun, A. I., & Pantsialeyeu, K. U. Universal Digital Probe Electrometer for Testing Semiconductor Wafers. Belarusian National Technical University.
Chicago Style (17th ed.) CitationZharin, A. L., U. A. Mikitsevich, A. I. Svistun, and K. U. Pantsialeyeu. Universal Digital Probe Electrometer for Testing Semiconductor Wafers. Belarusian National Technical University.
MLA (9th ed.) CitationZharin, A. L., et al. Universal Digital Probe Electrometer for Testing Semiconductor Wafers. Belarusian National Technical University.
Warning: These citations may not always be 100% accurate.