Yi, J., Jiang, H., & Tan, Y. The Detection of Soybean Bacterial Blight Based on Polarization Spectral Imaging Techniques. MDPI AG.
Chicago Style (17th ed.) CitationYi, Jia, Huilin Jiang, and Yong Tan. The Detection of Soybean Bacterial Blight Based on Polarization Spectral Imaging Techniques. MDPI AG.
MLA (9th ed.) CitationYi, Jia, et al. The Detection of Soybean Bacterial Blight Based on Polarization Spectral Imaging Techniques. MDPI AG.
Warning: These citations may not always be 100% accurate.