Bendada, E., & Raïs, K. Analysis of Hot-Carrier Degradation in Small and Large W/L n-Channel Transistors. Wiley.
Chicago Style (17th ed.) CitationBendada, E., and K. Raïs. Analysis of Hot-Carrier Degradation in Small and Large W/L n-Channel Transistors. Wiley.
MLA (9th ed.) CitationBendada, E., and K. Raïs. Analysis of Hot-Carrier Degradation in Small and Large W/L n-Channel Transistors. Wiley.
Warning: These citations may not always be 100% accurate.