Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage
This paper deals with the modeling of fault for analog circuits. A two-dimensional (2D) fault model is first proposed based on collaborative analysis of supply current and output voltage. This model is a family of circle loci on the complex plane, and it simplifies greatly the algorithms for test po...
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| Format: | Article |
| Language: | English |
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Wiley
2015-01-01
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| Series: | Journal of Applied Mathematics |
| Online Access: | http://dx.doi.org/10.1155/2015/851837 |
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| _version_ | 1832568265425027072 |
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| author | Hongzhi Hu Shulin Tian Qing Guo |
| author_facet | Hongzhi Hu Shulin Tian Qing Guo |
| author_sort | Hongzhi Hu |
| collection | DOAJ |
| description | This paper deals with the modeling of fault for analog circuits. A two-dimensional (2D) fault model is first proposed based on collaborative analysis of supply current and output voltage. This model is a family of circle loci on the complex plane, and it simplifies greatly the algorithms for test point selection and potential fault simulations, which are primary difficulties in fault diagnosis of analog circuits. Furthermore, in order to reduce the difficulty of fault location, an improved fault model in three-dimensional (3D) complex space is proposed, which achieves a far better fault detection ratio (FDR) against measurement error and parametric tolerance. To address the problem of fault masking in both 2D and 3D fault models, this paper proposes an effective design for testability (DFT) method. By adding redundant bypassing-components in the circuit under test (CUT), this method achieves excellent fault isolation ratio (FIR) in ambiguity group isolation. The efficacy of the proposed model and testing method is validated through experimental results provided in this paper. |
| format | Article |
| id | doaj-art-0fe91bfbab83441e8d27eadd9ce95d64 |
| institution | Kabale University |
| issn | 1110-757X 1687-0042 |
| language | English |
| publishDate | 2015-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Journal of Applied Mathematics |
| spelling | doaj-art-0fe91bfbab83441e8d27eadd9ce95d642025-02-03T00:59:19ZengWileyJournal of Applied Mathematics1110-757X1687-00422015-01-01201510.1155/2015/851837851837Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output VoltageHongzhi Hu0Shulin Tian1Qing Guo2School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, ChinaSchool of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, ChinaGuangxi Key Laboratory of Automatic Detecting Technology and Instrument, Guilin University of Electronic Technology, Guilin 541004, ChinaThis paper deals with the modeling of fault for analog circuits. A two-dimensional (2D) fault model is first proposed based on collaborative analysis of supply current and output voltage. This model is a family of circle loci on the complex plane, and it simplifies greatly the algorithms for test point selection and potential fault simulations, which are primary difficulties in fault diagnosis of analog circuits. Furthermore, in order to reduce the difficulty of fault location, an improved fault model in three-dimensional (3D) complex space is proposed, which achieves a far better fault detection ratio (FDR) against measurement error and parametric tolerance. To address the problem of fault masking in both 2D and 3D fault models, this paper proposes an effective design for testability (DFT) method. By adding redundant bypassing-components in the circuit under test (CUT), this method achieves excellent fault isolation ratio (FIR) in ambiguity group isolation. The efficacy of the proposed model and testing method is validated through experimental results provided in this paper.http://dx.doi.org/10.1155/2015/851837 |
| spellingShingle | Hongzhi Hu Shulin Tian Qing Guo Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage Journal of Applied Mathematics |
| title | Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage |
| title_full | Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage |
| title_fullStr | Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage |
| title_full_unstemmed | Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage |
| title_short | Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage |
| title_sort | fault modeling and testing for analog circuits in complex space based on supply current and output voltage |
| url | http://dx.doi.org/10.1155/2015/851837 |
| work_keys_str_mv | AT hongzhihu faultmodelingandtestingforanalogcircuitsincomplexspacebasedonsupplycurrentandoutputvoltage AT shulintian faultmodelingandtestingforanalogcircuitsincomplexspacebasedonsupplycurrentandoutputvoltage AT qingguo faultmodelingandtestingforanalogcircuitsincomplexspacebasedonsupplycurrentandoutputvoltage |