APA (7th ed.) Citation

Hu, H., Tian, S., & Guo, Q. Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage. Wiley.

Chicago Style (17th ed.) Citation

Hu, Hongzhi, Shulin Tian, and Qing Guo. Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage. Wiley.

MLA (9th ed.) Citation

Hu, Hongzhi, et al. Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage. Wiley.