A New Differential Magnetic-Field Probe With Parasitic Elements for Near-Field Scanning
Herein, A new differential magnetic-field probe with parasitic elements is presented. The proposed probe has two pairs of shorted differential loops as parasitic elements, which could enhance the detection sensitivity owing to the increased detection area. The proposed probe comprises a U-shaped loo...
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| Format: | Article |
| Language: | English |
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IEEE
2024-01-01
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| Series: | IEEE Photonics Journal |
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| Online Access: | https://ieeexplore.ieee.org/document/10509775/ |
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| _version_ | 1832087890718359552 |
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| author | Lei Wang Xiaoxian Liu Guoguang Lu Zhangming Zhu |
| author_facet | Lei Wang Xiaoxian Liu Guoguang Lu Zhangming Zhu |
| author_sort | Lei Wang |
| collection | DOAJ |
| description | Herein, A new differential magnetic-field probe with parasitic elements is presented. The proposed probe has two pairs of shorted differential loops as parasitic elements, which could enhance the detection sensitivity owing to the increased detection area. The proposed probe comprises a U-shaped loop with two outputs as the driven element, two pairs of shorted differential loops as parasitic elements, a pair of shorted via, a pair of connected via, and many shielded vias. First, the usual single-loop probe is theoretically studied. Second, a pair of shorted loops is inserted into the differential single-loop probe as a parasitic element to receive more magnetic flux. Third, another pair of shorted loops is etched into the probe to further improve the detection sensitivity. The corresponding simulation results are presented to prove the effectiveness of the design. Finally, the proposed probe with parasitic elements is designed, printed, and evaluated. Measurement results reveal that the designed probe has high detection sensitivity. |
| format | Article |
| id | doaj-art-05da3d3aa67243cc833608310bec24de |
| institution | Kabale University |
| issn | 1943-0655 |
| language | English |
| publishDate | 2024-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj-art-05da3d3aa67243cc833608310bec24de2025-02-06T00:00:11ZengIEEEIEEE Photonics Journal1943-06552024-01-011631510.1109/JPHOT.2024.339101210509775A New Differential Magnetic-Field Probe With Parasitic Elements for Near-Field ScanningLei Wang0https://orcid.org/0000-0002-9392-707XXiaoxian Liu1https://orcid.org/0000-0002-1798-7572Guoguang Lu2https://orcid.org/0000-0001-6310-7401Zhangming Zhu3https://orcid.org/0000-0002-7764-1928School of Microelectronics, Xidian University, Xi'an, Shaanxi, ChinaSchool of Microelectronics, Xidian University, Xi'an, Shaanxi, ChinaScience and Technology on Reliability Physics and Application of Electronic Component Laboratory, CEPREI, Guangzhou, ChinaSchool of Microelectronics, Xidian University, Xi'an, Shaanxi, ChinaHerein, A new differential magnetic-field probe with parasitic elements is presented. The proposed probe has two pairs of shorted differential loops as parasitic elements, which could enhance the detection sensitivity owing to the increased detection area. The proposed probe comprises a U-shaped loop with two outputs as the driven element, two pairs of shorted differential loops as parasitic elements, a pair of shorted via, a pair of connected via, and many shielded vias. First, the usual single-loop probe is theoretically studied. Second, a pair of shorted loops is inserted into the differential single-loop probe as a parasitic element to receive more magnetic flux. Third, another pair of shorted loops is etched into the probe to further improve the detection sensitivity. The corresponding simulation results are presented to prove the effectiveness of the design. Finally, the proposed probe with parasitic elements is designed, printed, and evaluated. Measurement results reveal that the designed probe has high detection sensitivity.https://ieeexplore.ieee.org/document/10509775/Detection sensitivitydifferential probenear-field scanning |
| spellingShingle | Lei Wang Xiaoxian Liu Guoguang Lu Zhangming Zhu A New Differential Magnetic-Field Probe With Parasitic Elements for Near-Field Scanning IEEE Photonics Journal Detection sensitivity differential probe near-field scanning |
| title | A New Differential Magnetic-Field Probe With Parasitic Elements for Near-Field Scanning |
| title_full | A New Differential Magnetic-Field Probe With Parasitic Elements for Near-Field Scanning |
| title_fullStr | A New Differential Magnetic-Field Probe With Parasitic Elements for Near-Field Scanning |
| title_full_unstemmed | A New Differential Magnetic-Field Probe With Parasitic Elements for Near-Field Scanning |
| title_short | A New Differential Magnetic-Field Probe With Parasitic Elements for Near-Field Scanning |
| title_sort | new differential magnetic field probe with parasitic elements for near field scanning |
| topic | Detection sensitivity differential probe near-field scanning |
| url | https://ieeexplore.ieee.org/document/10509775/ |
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