Direct Growth of High-Quality InP Layers on GaAs Substrates by MOCVD

In this report, we have overcome the drawback of surface roughness of metamorphic buffer layer by LP-MOCVD technique and have grown InP metamorphic buffer layers with various thickness on misoriented GaAs (1 0 0) substrates with 10 degree towards (1 1 1)A. The grown films are characterized by optica...

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Main Authors: K. F. Yarn, W. C. Chien, C. L. Lin, C. I. Liao
Format: Article
Language:English
Published: Wiley 2003-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1080/0882751031000073797
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author K. F. Yarn
W. C. Chien
C. L. Lin
C. I. Liao
author_facet K. F. Yarn
W. C. Chien
C. L. Lin
C. I. Liao
author_sort K. F. Yarn
collection DOAJ
description In this report, we have overcome the drawback of surface roughness of metamorphic buffer layer by LP-MOCVD technique and have grown InP metamorphic buffer layers with various thickness on misoriented GaAs (1 0 0) substrates with 10 degree towards (1 1 1)A. The grown films are characterized by optical microscopy, atomic force microscopy, secondary ion mass spectrometry, transmission electron microscopy and double-crystal X-ray diffraction. We also analyze the surface morphology, which is dependent on growth temperature, group III and group V partial pressure, growth rate and V/III ratios. A mirror-like, uniform surface and high crystal quality of the metamorphic buffer layer directly grown on a GaAs substrate can be achieved. Finally, to investigate the performance of the metamorphic microwave devices, we also fabricate the InAlAs/InGaAs metamorphic HEMT on GaAs substrates.
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spelling doaj-art-041f2303f1cd4910bbff64957d6d20f82025-02-03T01:10:16ZengWileyActive and Passive Electronic Components0882-75161563-50312003-01-01262717910.1080/0882751031000073797Direct Growth of High-Quality InP Layers on GaAs Substrates by MOCVDK. F. Yarn0W. C. Chien1C. L. Lin2C. I. Liao3Far East College, Department of Electrical Engineering, Optoelectronic Semiconductor Center, Hsin-Shih, Tainan, Taiwan 744, ChinaFar East College, Department of Electrical Engineering, Optoelectronic Semiconductor Center, Hsin-Shih, Tainan, Taiwan 744, ChinaDepartment of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 701, ChinaDepartment of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan 701, ChinaIn this report, we have overcome the drawback of surface roughness of metamorphic buffer layer by LP-MOCVD technique and have grown InP metamorphic buffer layers with various thickness on misoriented GaAs (1 0 0) substrates with 10 degree towards (1 1 1)A. The grown films are characterized by optical microscopy, atomic force microscopy, secondary ion mass spectrometry, transmission electron microscopy and double-crystal X-ray diffraction. We also analyze the surface morphology, which is dependent on growth temperature, group III and group V partial pressure, growth rate and V/III ratios. A mirror-like, uniform surface and high crystal quality of the metamorphic buffer layer directly grown on a GaAs substrate can be achieved. Finally, to investigate the performance of the metamorphic microwave devices, we also fabricate the InAlAs/InGaAs metamorphic HEMT on GaAs substrates.http://dx.doi.org/10.1080/0882751031000073797
spellingShingle K. F. Yarn
W. C. Chien
C. L. Lin
C. I. Liao
Direct Growth of High-Quality InP Layers on GaAs Substrates by MOCVD
Active and Passive Electronic Components
title Direct Growth of High-Quality InP Layers on GaAs Substrates by MOCVD
title_full Direct Growth of High-Quality InP Layers on GaAs Substrates by MOCVD
title_fullStr Direct Growth of High-Quality InP Layers on GaAs Substrates by MOCVD
title_full_unstemmed Direct Growth of High-Quality InP Layers on GaAs Substrates by MOCVD
title_short Direct Growth of High-Quality InP Layers on GaAs Substrates by MOCVD
title_sort direct growth of high quality inp layers on gaas substrates by mocvd
url http://dx.doi.org/10.1080/0882751031000073797
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