High Frequency Snubber Circuit for SiC MOSFET Module

During high frequency switching condition, overvoltage caused by the coupling oscillation between distributed parameters(inductance, capacitor) on Silicon Cabide(SiC) device will easily lead to breakdown damage of devices and the generated electromagnetic noise will interfere the normal operation of...

Full description

Saved in:
Bibliographic Details
Main Authors: LUO Jianbo, FAN Wei, PENG Kai
Format: Article
Language:zho
Published: Editorial Office of Control and Information Technology 2016-01-01
Series:Kongzhi Yu Xinxi Jishu
Subjects:
Online Access:http://ctet.csrzic.com/thesisDetails#10.13889/j.issn.2095-3631.2016.05.005
Tags: Add Tag
No Tags, Be the first to tag this record!