Analysis and Synthesis March Memory Tests
The paper shows the relevance of testing storage devices in modern computing systems. Mathematical models of memory device faults and the efficiency of their detection, in particular, complex pattern sensitive faults of the PNPSFk type, based on classical march memory tests are presented. Limit esti...
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| Format: | Article |
| Language: | Russian |
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Ministry of Education of the Republic of Belarus, Establishment The Main Information and Analytical Center
2021-07-01
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| Series: | Цифровая трансформация |
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| Online Access: | https://dt.bsuir.by/jour/article/view/612 |
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| author | V. N. Yarmolik V. A. Levantsevich D. V. Demenkovets |
| author_facet | V. N. Yarmolik V. A. Levantsevich D. V. Demenkovets |
| author_sort | V. N. Yarmolik |
| collection | DOAJ |
| description | The paper shows the relevance of testing storage devices in modern computing systems. Mathematical models of memory device faults and the efficiency of their detection, in particular, complex pattern sensitive faults of the PNPSFk type, based on classical march memory tests are presented. Limit estimates are given for the completeness of coverage of such faults depending on the number of memory cells involved in the fault. The necessity of synthesis of memory march tests characterized by high efficiency of PNPSFk failure detection is substantiated. The concept of a primitive providing conditions for activation and detection of various types of PNPSFk is defined. Examples of analysis and synthesis of memory march tests with different coverage of PNPSFk faults are given. The March OP memory test is synthesized, which is characterized by the maximum completeness of PNPSFk fault coverage and has the lowest time complexity compared to the known memory march tests, which provide the same comprehensiveness of coverage of complex memory device faults. |
| format | Article |
| id | doaj-art-01a09c7b686847f398df8993d710eeff |
| institution | Kabale University |
| issn | 2522-9613 2524-2822 |
| language | Russian |
| publishDate | 2021-07-01 |
| publisher | Ministry of Education of the Republic of Belarus, Establishment The Main Information and Analytical Center |
| record_format | Article |
| series | Цифровая трансформация |
| spelling | doaj-art-01a09c7b686847f398df8993d710eeff2025-02-03T11:26:35ZrusMinistry of Education of the Republic of Belarus, Establishment The Main Information and Analytical CenterЦифровая трансформация2522-96132524-28222021-07-01024555234Analysis and Synthesis March Memory TestsV. N. Yarmolik0V. A. Levantsevich1D. V. Demenkovets2Belarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsThe paper shows the relevance of testing storage devices in modern computing systems. Mathematical models of memory device faults and the efficiency of their detection, in particular, complex pattern sensitive faults of the PNPSFk type, based on classical march memory tests are presented. Limit estimates are given for the completeness of coverage of such faults depending on the number of memory cells involved in the fault. The necessity of synthesis of memory march tests characterized by high efficiency of PNPSFk failure detection is substantiated. The concept of a primitive providing conditions for activation and detection of various types of PNPSFk is defined. Examples of analysis and synthesis of memory march tests with different coverage of PNPSFk faults are given. The March OP memory test is synthesized, which is characterized by the maximum completeness of PNPSFk fault coverage and has the lowest time complexity compared to the known memory march tests, which provide the same comprehensiveness of coverage of complex memory device faults.https://dt.bsuir.by/jour/article/view/612computer systems testingmemory faultspattern sensitive faultsmarch testspseudo-exhaustive tests |
| spellingShingle | V. N. Yarmolik V. A. Levantsevich D. V. Demenkovets Analysis and Synthesis March Memory Tests Цифровая трансформация computer systems testing memory faults pattern sensitive faults march tests pseudo-exhaustive tests |
| title | Analysis and Synthesis March Memory Tests |
| title_full | Analysis and Synthesis March Memory Tests |
| title_fullStr | Analysis and Synthesis March Memory Tests |
| title_full_unstemmed | Analysis and Synthesis March Memory Tests |
| title_short | Analysis and Synthesis March Memory Tests |
| title_sort | analysis and synthesis march memory tests |
| topic | computer systems testing memory faults pattern sensitive faults march tests pseudo-exhaustive tests |
| url | https://dt.bsuir.by/jour/article/view/612 |
| work_keys_str_mv | AT vnyarmolik analysisandsynthesismarchmemorytests AT valevantsevich analysisandsynthesismarchmemorytests AT dvdemenkovets analysisandsynthesismarchmemorytests |