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  1. 1
    Electrical Characterization of Postmetal Annealed Ultrathin TiN Gate Electrodes in Si MOS Capacitors

    Electrical Characterization of Postmetal Annealed Ultrathin TiN Gate Electrodes in Si MOS Capacitors by Z. N. Khan, S. Ahmed, M. Ali

    Published 2016-01-01
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  2. 2
    Erratum to “Electrical Characterization of Postmetal Annealed Ultrathin TiN Gate Electrodes in Si MOS Capacitors”

    Erratum to “Electrical Characterization of Postmetal Annealed Ultrathin TiN Gate Electrodes in Si MOS Capacitors” by Z. N. Khan, S. Ahmed, M. Ali

    Published 2017-01-01
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